Thursday  |  Conference Center A  |  01:30 PM–01:50 PM

#13524, Local Multiphysics Measurements in Highly Deformable Media

This presentation focuses on multiphysics measurements of coupled local mechanical and electrical fields in highly deformable nanostructured elastomers. A miniature mechanical testing apparatus was developed for ultra-compact Atomic Force Microscopes (AFM) with capabilities for fast image acquisition and multimodal imaging. This apparatus, weighing just 8 grams with force capacity over 1 lb and strain range of 100% or more, was designed for an advanced AFM that is capable of providing fields of local out-of-plane, mechanical and electrical measurements, while in-plane strain fields are obtained from AFM topographic images with the aid of Digital Image Correlation (DIC). An integrated force measurement system provides force resolution better 0.05% FS. The reproducibility of AFM images of test specimens obtained at different scanning rates was evaluated with sub-pixel resolution derived through DIC. Furthermore, comparisons of the mechanical behavior of polydimethylsiloxane (PDMS) specimens were obtained from full-field microscale vs. macroscale strain measurements for applied strains up to 100% and AFM imaging rates up to 20 Hz. For higher imaging rates, photoexcitation of AFM cantilevers for scanning rates up to 40 Hz was utilized, which approaches the image acquisition rates of scanning electron microscopes (SEM) with the additional multimodal capabilities provided by an AFM.

Debashish Das   University of Illinois Urbana-Champaign
Oluwadara Moronkeji   University of Illinois Urbana-Champaign
Sunho Lee   University of Illinois Urbana-Champaign
Ioannis Chasiotis   University of Illinois Urbana-Champaign