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Monday | Heritage D | 09:00 AM–09:40 AM
#17596, Basics of Microscopy: SEM, TEM, AFM, EDS, EBSD
The objective of this SEM Educational Committee-supported presentation will be to provide foundational knowledge of popular microscopy techniques that are frequently leveraged to support material characterization and further understanding of material behavior. The targeted audience of the presentation is graduate students. However, anyone interested is encouraged to attend. First, the essential physics of scanning electron microscopy (SEM), transmission electron microscopy (TEM), atomic force microscopy (AFM), energy dispersive x-ray spectroscopy (EDS), and electron backscatter diffraction (EBSD) will be presented. The specimen requirements, types of data that can be collected using each technique, how that data can be utilized, and what insights can be obtained will be presented. Advanced and emergent approaches (e.g., high-resolution EBSD, electron channeling contrast imaging) will be briefly discussed, and references to further reading will be provided.