Creep Characterization of amorphous silica in the TEM Using In-situ Imaging Methods and Finite Element Analysis #13483
02:30 PM–02:50 PM - View
Yiguang Zhang  University of Illinois at Urbana-Champaign      Shen Dillon  University of California Irvine     John Lambros  University of Illinois at Urbana-Champaign                                                                                                                                       

Unravelling the Physics behind the Hygro-expansion of Paper: A Multi-scale Study #13528
02:50 PM–03:10 PM - View
Niels Vonk  Eindhoven University of Technology      Ron Peerlings  Eindhoven University of Technology     Marc Geers  Eindhoven University of Technology     Johan Hoefnagels  Eindhoven University of Technology                                                                                                                               

SerialTrack: ScalE and Rotation Invariant Augmented Lagrangian Particle Tracking #13706
03:10 PM–03:30 PM - View
Jin Yang  University of Wisconsin-Madison      Matthew Fu  California Institute of Technology     Yue Yin  Carnegie Mellon University     Alexander Landauer  National Institute of Standards and Technology     Selda Buyukozturk  Brown University     Jing Zhang  University of Wisconsin-Madison     Luke Summey  University of Wisconsin-Madison     Alexander McGhee  University of Wisconsin-Madison     John Dabiri  California Institute of Technology     Christian Franck  University of Wisconsin